Published 2004 | Version v1
Miscellaneous Metadata-only

Diffuse scattering effects in X-ray reflection coefficients for ion-implanted single crystals

Creators

  • 1. G.V. Kurdyumov Institute of Metal Physics, NASU, Kiev (Ukraine)

Description

no abstract available

Part of:
Abstracts of International Conference on Experimental and Computing Methods in High Resolution Diffraction Applied for Structure Characterization of Modern Materials - HREDAMM

Additional details

Publishing Information

Imprint Title
Abstracts of International Conference on Experimental and Computing Methods in High Resolution Diffraction Applied for Structure Characterization of Modern Materials - HREDAMM
Imprint Pagination
98 p.
Journal Page Range
p. 75-76

Conference

Title
International Conference on Experimental and Computing Methods in High Resolution Diffraction Applied for Structure Characterization of Modern Materials - HREDAMM
Dates
13-17 Jun 2004
Place
Zakopane (Poland)

INIS

Country of Publication
Poland
Country of Input or Organization
Poland
INIS RN
37011115
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
No Abstract, Conference, Non-conventional Literature
Descriptors DEI
CRYSTAL DEFECTS; DIFFUSE SCATTERING; GADOLINIUM COMPOUNDS; ION IMPLANTATION; MONOCRYSTALS; NEODYMIUM IONS; OXIDES; STRAINS; X-RAY DIFFRACTION
Descriptors DEC
CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL STRUCTURE; CRYSTALS; DIFFRACTION; IONS; OXYGEN COMPOUNDS; RARE EARTH COMPOUNDS; SCATTERING

Optional Information

Notes
6 refs, 1 fig.