Large interface diffusion in endotaxial growth of MnP films on GaP substrates
Creators
- 1. Regroupement québécoise sur les matériaux de pointe (RQMP), Département de Génie Physique, Polytechnique Montréal, C.P. 6079, succ. Centre-ville, Montréal, Québec H3C 3A7 (Canada)
Description
The metal organic vapor deposition of MnP films on GaP (100) substrates is shown to have a substantial endotaxial component. A study of the growth time evolution of the endotaxial depths of MnP grains reveals a diffusion-controlled growth with a relatively large diffusion coefficient of Mn in GaP. The value (2.2 ± 1.5) × 10−15 (cm2/s) obtained at 650 °C is at least two orders of magnitude larger than the reported Mn diffusion in bulk GaP. GaP surface mounds provide further indirect evidence that this large diffusion coefficient is concurrent with the out-diffusion of Ga atoms at the growing MnP/GaP interface. No trace of dislocations could be observed at or near this interface, which strongly suggests that Mn diffusion occurs through vacant sites generated by the difference between the crystallographic structures of MnP and GaP.
Additional details
Identifiers
- DOI
- 10.1063/1.4896910;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 116
- Journal Issue
- 13
- Journal Page Range
- p. 133512-133512.6
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46011919
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ATOMS; CRYSTAL GROWTH; CRYSTALLOGRAPHY; DIFFUSION; DISLOCATIONS; EVOLUTION; FILMS; GALLIUM PHOSPHIDES; INTERFACES; MANGANESE PHOSPHIDES; ORGANOMETALLIC COMPOUNDS; SUBSTRATES; SURFACES
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; GALLIUM COMPOUNDS; LINE DEFECTS; MANGANESE COMPOUNDS; ORGANIC COMPOUNDS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC