Controlled synthesis of gas sensing Cr2-xTi xO3 films by electrostatic spray assisted vapour deposition and their structural characterisation
Creators
- 1. School of Mechanical, Materials and Manufacturing Engineering, University of Nottingham, NG7 2RD (United Kingdom)
- 2. Department of Materials, Imperia College London, SW7 2AZ (United Kingdom)
Description
Titanium substituted chromium oxide Cr2-xTi xO3 is an excellent gas sensor material, which can be applied at the elevated temperatures for the detection of combustible and toxic gases. A versatile and cost-effective Electrostatic Spray Assisted Vapour Deposition (ESAVD) is used to prepare Cr2-xTi xO3 materials. The crystalline phase, composition and microstructure of Cr2-xTi xO3 films prepared by ESAVD are characterised by X-ray diffraction, scanning electron microscope, X-ray photoelectron spectroscopy and Raman microscope. In this paper, we report the relationships between the processing parameters and the microstructure of the deposited films. The Cr1.8Ti0.2O3 films with more ordered porous structure and smaller grain size deposited by ESAVD show a typical sensing behaviour with the sensitivity of around 45% at 500 deg. C to 500 ppm ammonia
Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2005.09.169;
- PII
- S0040-6090(05)01830-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 497
- Journal Issue
- 1-2
- Journal Page Range
- p. 42-47
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37112351
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHROMIUM OXIDES; FILMS; GRAIN SIZE; MICROSCOPES; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SENSITIVITY; SPRAY COATING; SURFACES; SYNTHESIS; TITANIUM OXIDES; VAPOR DEPOSITED COATINGS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHROMIUM COMPOUNDS; COATINGS; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; MATERIALS; MICROSCOPY; MICROSTRUCTURE; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; SCATTERING; SIZE; SPECTROSCOPY; SURFACE COATING; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.