Published 1995 | Version v1
Miscellaneous

Study regarding the annealing technology of LiF detectors encapsulated in teflon

  • 1. Department of Radiation Dosimetry and Detectors, Institute of Physics and Nuclear Enginering, Institute of Atomic Physics, PO Box MG-6, R-76900 Bucharest, (Romania)

Description

The recognized procedure for regeneration of thermoluminescent detectors of lithium fluoride after read-out is to anneal at 4000 C for 1.5 hours followed by 800 C for 24 hours. The standard annealing procedure cannot be used for detectors of LiF encapsulated in Teflon because the Teflon undergoes a change of state at 3270 C and during the annealing a toxic gas is given off from the heated Teflon. Three annealing procedures at lower temperature have been applied. The chosen annealing procedure was: 800 C for 24 hours. (author)

Availability note (English)

Available from Romanian Physical Society, PO Box MG-6, R-76900 Bucharest, (RO).
Part of:
National Physics Conference. Paper Abstracts

Additional details

Publishing Information

Publisher
Institute of Atomic Physics. Information and Documentation Office.
Imprint Place
Bucharest (Romania)
Imprint Title
National Physics Conference. Baia Mare 30 Nov - 02 Dec 1995
Imprint Pagination
151 p.
Journal Page Range
p. 134.

Conference

Title
National Physics Conference.
Dates
30 Nov - 2 Dec 1995.
Place
Baia Mare (Romania).

Optional Information

Notes
Imprint:Paper Abstracts.