Published March 2009
| Version v1
Journal article
Characterization of MX-80 bentonite and its sorption of radionickel in the presence of humic and fulvic acids
Creators
- 1. Chinese Academy of Sciences, Hefei (China). Institute of Plasma Physics
- 2. North China Electric Power University, Beijing (China). School of Nuclear Science and Engineering
- 3. Shandong University of Technology, Zibo (China). School of Chemical Engineering
Description
MX-80 bentonite is considered as one of the best backfill materials for high-level radioactive nuclear waste. Herein, the bentonite is characterized by using XRD and FTIR techniques. Sorption of radionickel to MX-80 bentonite in the presence/absence of humic acid (HA) or fulvic acid (FA) as a function of pH is investigated. The results indicate that the presence of HA or FA decreases the sorption of Ni2+ obviously. The different experimental processes do not affect the sorption of nickel to FA/HA bound bentonite. The sorption of Ni2+ on FA/HA-bound bentonite decreases with the increasing FA/HA content in the systems. The mechanism of nickel sorption is also discussed in detail. (author)
Additional details
Publishing Information
- Journal Title
- Journal of Radioanalytical and Nuclear Chemistry
- Journal Volume
- 279
- Journal Issue
- 3
- Journal Page Range
- p. 701-708
- ISSN
- 0236-5731
- CODEN
- JRNCDM
INIS
- Country of Publication
- Hungary
- Country of Input or Organization
- Hungary
- INIS RN
- 40055542
- Subject category
- S38: RADIATION CHEMISTRY, RADIOCHEMISTRY AND NUCLEAR CHEMISTRY; S12: MANAGEMENT OF RADIOACTIVE WASTES, AND NON-RADIOACTIVE WASTES FROM NUCLEAR FACILITIES; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- BENTONITE; FULVIC ACIDS; HUMIC ACIDS; NICKEL; SORPTION; X-RAY DIFFRACTION
- Descriptors DEC
- CLAYS; COHERENT SCATTERING; DIFFRACTION; ELEMENTS; INORGANIC ION EXCHANGERS; ION EXCHANGE MATERIALS; MATERIALS; METALS; MINERALS; ORGANIC ACIDS; ORGANIC COMPOUNDS; SCATTERING; SILICATE MINERALS; TRANSITION ELEMENTS
Optional Information
- Notes
- 16 refs.