Published 1975
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High-resolution observation of phase contrast at 1MeV. Amorphous or crystalline objects
Description
Many authors have stressed the possibilities of high voltage to improve resolution, but owing to numerous experimental difficulties the resolution limit at 1MeV, which lies around 1A for conventional lenses, has so far been unattainable. Thus the phase contrast at 1MeV has not been studied on evaporated objects. On the other hand the fringes of crystal planes have been observed at 1MeV. the CEN-G microscope having been considerably modified it has been possible to observe the phase contrast of amorphous or crystalline objects
Availability note (English)
MF available from INIS under the Report Number.Abstract (French)
De tres nombreux auteurs ont souligne l'interet de la haute tension pour ameliorer la resolution. Cependant de nombreuses difficultes experimentales ont jusqu'ici empeche d'atteindre la resolution limite a 1MeV qui se situe autour de 1A pour des objectifs classiques. Ainsi le contraste de phase a 1MeV n'a pas ete etudie sur les objets evapores. Par contre les franges de plans cristallins ont ete observees a 1MeV. D'importantes modifications ayant ete apportees au microscope du CEN-G, il a ete possible d'observer le contraste de phase d'objets amorphes ou cristallinsFiles
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Additional details
Additional titles
- Original title (French)
- Observation a haute resolution du contraste de phase a 1MeV. Objets amorphes ou cristallins
Publishing Information
- Imprint Pagination
- 4 p.
- Report number
- CEA-CONF--3206
Conference
- Title
- 4. International congress on high voltage electron microscopy.
- Dates
- 01 Sep 1975.
- Place
- Toulouse, France.
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 7242779
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRON MICROSCOPY; HABIT PLANES; RESOLUTION
- Descriptors DEC
- MICROSCOPY