Published 1975 | Version v1
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High-resolution observation of phase contrast at 1MeV. Amorphous or crystalline objects

Description

Many authors have stressed the possibilities of high voltage to improve resolution, but owing to numerous experimental difficulties the resolution limit at 1MeV, which lies around 1A for conventional lenses, has so far been unattainable. Thus the phase contrast at 1MeV has not been studied on evaporated objects. On the other hand the fringes of crystal planes have been observed at 1MeV. the CEN-G microscope having been considerably modified it has been possible to observe the phase contrast of amorphous or crystalline objects

Availability note (English)

MF available from INIS under the Report Number.

Abstract (French)

De tres nombreux auteurs ont souligne l'interet de la haute tension pour ameliorer la resolution. Cependant de nombreuses difficultes experimentales ont jusqu'ici empeche d'atteindre la resolution limite a 1MeV qui se situe autour de 1A pour des objectifs classiques. Ainsi le contraste de phase a 1MeV n'a pas ete etudie sur les objets evapores. Par contre les franges de plans cristallins ont ete observees a 1MeV. D'importantes modifications ayant ete apportees au microscope du CEN-G, il a ete possible d'observer le contraste de phase d'objets amorphes ou cristallins

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Additional details

Additional titles

Original title (French)
Observation a haute resolution du contraste de phase a 1MeV. Objets amorphes ou cristallins

Publishing Information

Imprint Pagination
4 p.
Report number
CEA-CONF--3206

Conference

Title
4. International congress on high voltage electron microscopy.
Dates
01 Sep 1975.
Place
Toulouse, France.

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
7242779
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON MICROSCOPY; HABIT PLANES; RESOLUTION
Descriptors DEC
MICROSCOPY