Published 2010
| Version v1
Journal article
Quantitative material reconstruction with the Medipix2 detector with CdTe sensor
- 1. ECAP, Universitaet Erlangen (Germany)
Description
no abstract available
Additional details
Additional titles
- Original title (German)
- Quantitative Materialrekonstruktion mit dem Medipix2 Detektor mit CdTe Sensor
Identifiers
Publishing Information
- Journal Title
- Verhandlungen der Deutschen Physikalischen Gesellschaft
- Journal Issue
- Regensburg 2010 issue
- Series
- Also available as printed version: Verhandlungen der Deutschen Physikalischen Gesellschaft v. 45(3)
- Journal Page Range
- [1 p.]
- ISSN
- 0420-0195
- CODEN
- VDPEAZ
Conference
- Title
- DPG Spring meeting 2010 of the condensed matter section with the divisions biological physics, chemical and polymer physics, crystallography, dielectric solids, dynamics and statistical physics, low temperature physics, magnetism, metal and material physics, physics of socio-economic systems, radiation and medical physics, semiconductor physics, surface science, thin films, vacuum science and technology as well as the working group industry and business, with job market, symposia, teachers' days, tutorials, exhibition of scientific instruments and literature
- Dates
- 21-26 Mar 2010
- Place
- Regensburg (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 42068225
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S62: RADIOLOGY AND NUCLEAR MEDICINE;
- Resource subtype / Literary indicator
- Conference, No Abstract
- Descriptors DEI
- BIOMEDICAL RADIOGRAPHY; CDTE SEMICONDUCTOR DETECTORS; INTEGRATED CIRCUITS; RADIOMETRIC ANALYSIS; SIMULATION; X-RAY DETECTION; X-RAY RADIOGRAPHY
- Descriptors DEC
- CHEMICAL ANALYSIS; DETECTION; DIAGNOSTIC TECHNIQUES; ELECTRONIC CIRCUITS; INDUSTRIAL RADIOGRAPHY; MATERIALS TESTING; MEASURING INSTRUMENTS; MEDICINE; MICROELECTRONIC CIRCUITS; NONDESTRUCTIVE TESTING; NUCLEAR MEDICINE; QUANTITATIVE CHEMICAL ANALYSIS; RADIATION DETECTION; RADIATION DETECTORS; RADIOLOGY; SEMICONDUCTOR DETECTORS; TESTING
Optional Information
- Notes
- Session: ST 1.4 Mo 11:30