X-ray diagnostics for fusion plasmas
Description
Medium and high resolution X-ray crystal spectrometers have been developed for measurements of charge state distributions of impurity ions, density of suprathermal electrons and ion temperature in magnetically confined plasmas. The techniques utilizing these spectrometers are, in principle, applicable to laser produced plasmas, especially in their expanding phase. The role of X-ray spectroscopy to produce useful data for atomic physics as well as for plasma diagnostics is emphasized. A beam-line has been designed and installed to the Ultraviolet Synchrotron Radiation Facility (UVSOR) at IMS, Okazaki, for the purpose of establishing calibration techniques for optical components, detectors and spectrometers in the range from ultraviolet to soft X ray for plasma diagnostics. Characteristics of the beam and its application to the study of interaction between synchrotron radiation and hot dense plasmas are described. Synchrotron radiation can replace the dye laser which has so far been used as a light source in the laser-induced fluorescence method to obtain population density of specified levels in a plasma. (author)
Additional details
Publishing Information
- Journal Title
- Laser and Particle Beams
- Journal Volume
- 7
- Journal Issue
- pt.3
- Series
- Laser Part. Beams.
- Journal Page Range
- 483-486
- ISSN
- 0263-0346
- CODEN
- LPBED
Conference
- Title
- U.S.-Japan seminar on generation and application of hot dense laser plasma.
- Dates
- 8-12 Aug 1988.
- Place
- Honolulu, HI (USA).
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 21088684
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE STATES; ELECTRON DENSITY; FLUORESCENCE SPECTROSCOPY; HOT PLASMA; ION TEMPERATURE; LASER SPECTROSCOPY; LASER-PRODUCED PLASMA; PLASMA DIAGNOSTICS; PLASMA IMPURITIES; X-RAY SPECTROMETERS
- Descriptors DEC
- EMISSION SPECTROSCOPY; IMPURITIES; MEASURING INSTRUMENTS; PLASMA; SPECTROMETERS; SPECTROSCOPY