Published August 1989 | Version v1
Journal article

X-ray diagnostics for fusion plasmas

  • 1. Nagoya Univ. (Japan). Inst. of Plasma Physics

Description

Medium and high resolution X-ray crystal spectrometers have been developed for measurements of charge state distributions of impurity ions, density of suprathermal electrons and ion temperature in magnetically confined plasmas. The techniques utilizing these spectrometers are, in principle, applicable to laser produced plasmas, especially in their expanding phase. The role of X-ray spectroscopy to produce useful data for atomic physics as well as for plasma diagnostics is emphasized. A beam-line has been designed and installed to the Ultraviolet Synchrotron Radiation Facility (UVSOR) at IMS, Okazaki, for the purpose of establishing calibration techniques for optical components, detectors and spectrometers in the range from ultraviolet to soft X ray for plasma diagnostics. Characteristics of the beam and its application to the study of interaction between synchrotron radiation and hot dense plasmas are described. Synchrotron radiation can replace the dye laser which has so far been used as a light source in the laser-induced fluorescence method to obtain population density of specified levels in a plasma. (author)

Additional details

Publishing Information

Journal Title
Laser and Particle Beams
Journal Volume
7
Journal Issue
pt.3
Series
Laser Part. Beams.
Journal Page Range
483-486
ISSN
0263-0346
CODEN
LPBED

Conference

Title
U.S.-Japan seminar on generation and application of hot dense laser plasma.
Dates
8-12 Aug 1988.
Place
Honolulu, HI (USA).

INIS

Country of Publication
United Kingdom
Country of Input or Organization
United Kingdom
INIS RN
21088684
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE STATES; ELECTRON DENSITY; FLUORESCENCE SPECTROSCOPY; HOT PLASMA; ION TEMPERATURE; LASER SPECTROSCOPY; LASER-PRODUCED PLASMA; PLASMA DIAGNOSTICS; PLASMA IMPURITIES; X-RAY SPECTROMETERS
Descriptors DEC
EMISSION SPECTROSCOPY; IMPURITIES; MEASURING INSTRUMENTS; PLASMA; SPECTROMETERS; SPECTROSCOPY