Published July 1981 | Version v1
Journal article

Thickness gaging with scattered β, γ and X-rays

Creators

  • 1. Shiraz Univ. (Iran). Radiation Protection Center

Description

A few radiation sources have been studied for possible use in quality control to gage thickness of glass containers using backscattering technique. 241Am proved as the proper source. (author)

Additional details

Publishing Information

Journal Title
Int. J. Appl. Radiat. Isot.
Journal Volume
32
Journal Issue
7
Series
Int. J. Appl. Radiat. Isot.
Journal Page Range
524-526
ISSN
0020-708X