Published December 1994 | Version v1
Journal article Metadata-only

Dependence of total dose response of bipolar linear microcircuits on applied dose rate

Creators

  • 1. Hughes Space and Communications Co., Los Angeles, CA (United States)
  • 2. Boeing Defense and Space Group, Seattle, WA (United States)

Description

The effect of dose rate on the total dose radiation hardness of three commercial bipolar linear microcircuits is investigated. Total dose tests of linear bipolar microcircuits show larger degradation at 0.167 rad/s than at 90 rad/s even after the high dose rate test is followed by a room temperature plus a 100 C anneal. No systematic correlation could be found for degradation at low dose rate versus high dose rate and anneal. Comparison of the low dose rate with the high dose rate anneal data indicates that MIL-STD-883, method 1019.4 is not a worst-case test method when applied to bipolar microcircuits for low dose rate space applications

Additional details

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
41
Journal Issue
6Pt1
Journal Page Range
p. 2544-2549.
ISSN
0018-9499
CODEN
IETNAE

Conference

Title
31. annual international nuclear and space radiation effects conference.
Dates
18-22 Jul 1994.
Place
Tucson, AZ (United States).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
26050826
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
ANNEALING; COMPARATIVE EVALUATIONS; DOSE RATES; ELECTRICAL PROPERTIES; EXPERIMENTAL DATA; MICROELECTRONIC CIRCUITS; RADIATION HARDENING
Descriptors DEC
DATA; ELECTRONIC CIRCUITS; EVALUATION; HARDENING; HEAT TREATMENTS; INFORMATION; NUMERICAL DATA; PHYSICAL PROPERTIES; PHYSICAL RADIATION EFFECTS; RADIATION EFFECTS

Optional Information

Secondary number(s)
CONF-940726--.