Published January 1999 | Version v1
Journal article Metadata-only

Nonlinear flux-line dynamics in vanadium films with square lattices of submicron holes

Creators

  • 1. MSD, Argonne National Laboratory, Argonne, Illinois 60439-4845 (United States)
  • 2. University of New Mexico, Albuquerque, New Mexico 87131 (United States)
  • 3. University of Kentucky, Lexington, Kentucky 40506-0055 (United States)
  • 4. EECS, University of Illinois at Chicago, Chicago, Illinois 60607 (United States)

Description

Commensurability effects between the superconducting flux-line lattice and a square lattice (period d=1μm) of submicron holes (diameter D=0.4μm) in 1500 Angstrom vanadium films were studied by atomic-force microscopy, dc magnetization, ac susceptibility, magnetoresistivity, and I-V measurements. Peaks in the susceptibility and critical current at matching fields are found to depend nonlinearly upon the value of external ac field or current, as well as the inferred symmetry of the flux-line lattice. copyright 1999 The American Physical Society

Additional details

Publishing Information

Journal Title
Physical Review. B, Condensed Matter
Journal Volume
59
Journal Issue
1
Journal Page Range
p. 603-607
ISSN
0163-1829
CODEN
PRBMDO

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
30010849
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
MAGNETIC FLUX; MAGNETIZATION; MAGNETORESISTANCE; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; THIN FILMS; VANADIUM
Descriptors DEC
ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; METALS; PHYSICAL PROPERTIES; TRANSITION ELEMENTS