Published 2010
| Version v1
Journal article
Topographic X-ray characterization of GGG homoepitaxial layers with introduced divalent ions of transition-metals
- 1. Institute of Electronic Materials Technology, 133, Wolczynska Str, 01 919 Warsaw (Poland)
- 2. Institute of Atomic Energy, 05 400 Swierk-Otwock (Poland)
- 3. Soltan Institute for Nuclear Studies, 05-400 Swierk-Otwock (Poland)
Description
no abstract available
Additional details
Identifiers
Publishing Information
- Journal Title
- Synchrotron Radiation in Natural Science
- Journal Volume
- 9
- Journal Issue
- 1-2
- Journal Page Range
- p. 95
- ISSN
- 1644-7190
Conference
- Title
- 10. International School and Symposium on Synchrotron Radiation in Natural Science
- Acronym
- ISSNRS-10
- Dates
- 6-11 Jun 2010
- Place
- Szklarska Poreba (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 43006091
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference
- Descriptors DEI
- COBALT IONS; CRYSTAL DOPING; EPITAXY; GADOLINIUM COMPOUNDS; GALLIUM COMPOUNDS; NICKEL IONS; OPTICAL PROPERTIES; OXIDES; SYNCHROTRON RADIATION; THIN FILMS; TOPOGRAPHY; TRANSITION ELEMENTS; X-RAY DIFFRACTION
- Descriptors DEC
- BREMSSTRAHLUNG; CHALCOGENIDES; CHARGED PARTICLES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELEMENTS; FILMS; IONS; METALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; RARE EARTH COMPOUNDS; SCATTERING
Optional Information
- Notes
- 2 refs.