Published February 1, 2006 | Version v1
Journal article

Domain structure of Fe-based microwires

  • 1. Instituto de Ciencias de Materiales de Madrid, CSIC, Campus Cantoblanco, 28040 Madrid (Spain)
  • 2. CCPF TM 'TEMED', Chisinau, P.O. Box 20082, Moldova (Moldova, Republic of)
  • 3. Instituto de Ciencias de Materiales de Madrid, CSIC, Campus Cantoblanco, 28040 Madrid (Spain) and Departamento de Fisica, Universidad Tecnica Federico Santa Maria, Casilla 110-V, Valparaiso (Chile) and Instituto de Fisica, Pontificia Universidad Catolica de Valparaiso, Casilla 4059, Valparaiso (Chile)
  • 4. Departamento de Fisica, Universidad Tecnica Federico Santa Maria, Casilla 110-V, Valparaiso (Chile)

Description

Some magnetic characteristics of the Fe-based cast amorphous glass-coated microwires with positive magnetostriction constant are investigated. The residual stress distributions in this type of microwires determine the domain structures and the switching field behavior; in particular, we present a phenomenological law of its temperature dependence, which has a very good agreement with the experimental data

Additional details

Identifiers

DOI
10.1016/j.physb.2005.10.077;
PII
S0921-4526(05)01124-5;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
372
Journal Issue
1-2
Journal Page Range
p. 324-327
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
5. international symposium on hysteresis and micromagnetic modeling
Dates
30 May - 1 Jun 2005
Place
Budapest (Hungary)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37070000
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AMORPHOUS STATE; DISTRIBUTION; DOMAIN STRUCTURE; GLASS; IRON BASE ALLOYS; MAGNETOSTRICTION; RESIDUAL STRESSES; TEMPERATURE DEPENDENCE
Descriptors DEC
ALLOYS; IRON ALLOYS; MAGNETIC PROPERTIES; PHYSICAL PROPERTIES; STRESSES; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.