Published 1972
| Version v1
Report
Open
On the application of charged particle activation analysis to the trace characterization of semiconductor materials
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.Files
4053076.pdf
Files
(2.4 MB)
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Additional details
Publishing Information
- Imprint Pagination
- 16 p.
- Report number
- INIS-mf--545
Conference
- Title
- International colloquium on the activation analysis of micro-quantities of elements in very high-purity inorganic and organic substances and in biological media.
- Dates
- 02 Oct 1972.
- Place
- Saclay, France.
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 4053076
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; ACTIVATION ANALYSIS; ALPHA BEAMS; COINCIDENCE METHODS; GAMMA DETECTION; HELIUM 3 BEAMS; MEV RANGE 10-100; NONDESTRUCTIVE TESTING; OXYGEN; PROTON BEAMS; SENSITIVITY; SILICON; TRACE AMOUNTS
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; COUNTING TECHNIQUES; ELEMENTS; ENERGY RANGE; HELIUM; HELIUM ISOTOPES; ION BEAMS; MATERIALS TESTING; MEV RANGE; NONMETALS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTION; RARE GASES; SEMIMETALS; TESTING