Published February 15, 2000
| Version v1
Journal article
Anomalous flipping motions of buckled dimers on the Si(001) surface at 5 K
- 1. Department of Material Science and Engineering, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8502 (Japan)
- 2. Takayanagi Particle Surface Project, ERATO, Japan Science and Technology Corporation, 3-1-2 Musashino, Akishima, Tokyo 196-8558 (Japan)
Description
We report on dynamical flipping of buckled dimers on the Si(001) surface at 5 K. A c(4x2) ordering of the buckled dimers has been observed to fluctuate at 5 K by using low-temperature scanning tunneling microscopy (STM). The flip-flop motion of the buckled dimers on the Si(001) surface exhibits symmetrical appearance in the STM images, independent of sample bias voltages and tunneling current
Additional details
Identifiers
- DOI
- 10.1103/PhysRevB.61.R5078;
- PII
- S0163-1829(00)50908-4;
Publishing Information
- Journal Title
- Physical Review. B, Condensed Matter and Materials Physics
- Journal Volume
- 61
- Journal Issue
- 8
- Journal Page Range
- p. R5078-R5081
- ISSN
- 1098-0121
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35071605
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- DIMERS; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACES; TEMPERATURE RANGE 0000-0013 K; TOPOGRAPHY; TUNNEL EFFECT
- Descriptors DEC
- ELEMENTS; MICROSCOPY; SEMIMETALS; TEMPERATURE RANGE
Optional Information
- Notes
- (c) 2000 The American Physical Society