Published October 1, 2010
| Version v1
Journal article
The dielectric environment dependent exchange self-energy of the energy structure in graphene
Creators
- 1. Faculty of Maths and Physics, Nanjing University of Information Science and Technology, Nanjing 210044 (China)
- 2. Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031 (China)
Description
We theoretically calculate the energy dispersion in the presence of the screened exchange self-energy in extrinsic monolayer graphene. It is found that the exchange self-energy enhances the renormalized Fermi velocity. With decreasing the dielectric constant, the screening effect and the electron correlation effect increase which induces the Fermi velocity increasing. The screened exchange energy has an energy shift at the Dirac points. The self-energy from the valance band carriers gives the main contribution to the effective energy. We also discuss the electron density dependence of the self-energy.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2010.07.007Additional details
Identifiers
- DOI
- 10.1016/j.physb.2010.07.007;
- PII
- S0921-4526(10)00694-0;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 405
- Journal Issue
- 19
- Journal Page Range
- p. 4170-4172
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41132777
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CARBON; COMPUTERIZED SIMULATION; DIELECTRIC MATERIALS; DISPERSIONS; ELECTRON CORRELATION; ELECTRON DENSITY; ELECTRON GAS; EXCHANGE INTERACTIONS; HONEYCOMB STRUCTURES; NANOSTRUCTURES; PERMITTIVITY; SCREENING; SELF-ENERGY; TWO-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- CORRELATIONS; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; ELEMENTS; ENERGY; INTERACTIONS; MATERIALS; MECHANICAL STRUCTURES; NONMETALS; PHYSICAL PROPERTIES; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.