Published September 1993
| Version v1
Journal article
Measurement technique of the pulsed ionizing radiation doses by semiconductor diode, operating in nonlinear regime
- 1. Nauchno-Issledovatel'skij Inst. 'Sapfir', Moscow (Russian Federation)
Description
The paper describes a technique for applying semiconducting diodes to measure pulsed ionizing radiation dose, dose rate being >1010 R/S. The results of experimental testing of the measuring technique in bremsstrahlung field of a pulse electron accelerator are presented for 1010-1012 R/S dose rate and 25 ns radiation pulse length
Additional details
Additional titles
- Original title (Russian)
- Способ измерения дозы импульсного ионизирующего излучения полупроводниковым диодом, работающим в нелинейном режиме
Publishing Information
- Journal Title
- Pribory i Tekhnika Ehksperimenta
- Journal Issue
- no.5
- Journal Page Range
- p. 64-68.
- ISSN
- 0032-8162
- CODEN
- PRTEAJ
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- Russian Federation
- INIS RN
- 25044903
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BREMSSTRAHLUNG; DOSEMETERS; ERRORS; PULSED IRRADIATION; RADIATION DOSES; SEMICONDUCTOR DIODES
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; IRRADIATION; MEASURING INSTRUMENTS; RADIATIONS; SEMICONDUCTOR DEVICES