Published May 1, 2018 | Version v1
Journal article

System Analysis by Mapping a Fault-tree into a Bayesian-network

  • 1. Department of Mechanical Engineering, The University of Auckland, Auckland (New Zealand)
  • 2. School of Mechanical Science & Engineering, Huazhong University of Science & Technology, Wuhan (China)
  • 3. China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou (China)

Description

In view of the limitations of fault tree analysis in reliability assessment, Bayesian Network (BN) has been studied as an alternative technology. After a brief introduction to the method for mapping a Fault Tree (FT) into an equivalent BN, equations used to calculate the structure importance degree, the probability importance degree and the critical importance degree are presented. Furthermore, the correctness of these equations is proved mathematically. Combining with an aircraft landing gear's FT, an equivalent BN is developed and analysed. The results show that richer and more accurate information have been achieved through the BN method than the FT, which demonstrates that the BN is a superior technique in both reliability assessment and fault diagnosis. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/362/1/012025

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
362
Journal Issue
1
Journal Page Range
[8 p.]
ISSN
1757-899X

Conference

Title
International Conference on Smart Engineering Materials
Acronym
ICSEM 2018
Dates
7-9 Mar 2018
Place
Bucharest (Romania)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52091663
Subject category
S97: MATHEMATICAL METHODS AND COMPUTING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BAYESIAN STATISTICS; COMPUTERIZED SIMULATION; FAULT TREE ANALYSIS; MAPPING; RELIABILITY
Descriptors DEC
MATHEMATICS; SIMULATION; STATISTICS; SYSTEM FAILURE ANALYSIS; SYSTEMS ANALYSIS