System Analysis by Mapping a Fault-tree into a Bayesian-network
Creators
- 1. Department of Mechanical Engineering, The University of Auckland, Auckland (New Zealand)
- 2. School of Mechanical Science & Engineering, Huazhong University of Science & Technology, Wuhan (China)
- 3. China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou (China)
Description
In view of the limitations of fault tree analysis in reliability assessment, Bayesian Network (BN) has been studied as an alternative technology. After a brief introduction to the method for mapping a Fault Tree (FT) into an equivalent BN, equations used to calculate the structure importance degree, the probability importance degree and the critical importance degree are presented. Furthermore, the correctness of these equations is proved mathematically. Combining with an aircraft landing gear's FT, an equivalent BN is developed and analysed. The results show that richer and more accurate information have been achieved through the BN method than the FT, which demonstrates that the BN is a superior technique in both reliability assessment and fault diagnosis. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/362/1/012025Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 362
- Journal Issue
- 1
- Journal Page Range
- [8 p.]
- ISSN
- 1757-899X
Conference
- Title
- International Conference on Smart Engineering Materials
- Acronym
- ICSEM 2018
- Dates
- 7-9 Mar 2018
- Place
- Bucharest (Romania)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52091663
- Subject category
- S97: MATHEMATICAL METHODS AND COMPUTING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BAYESIAN STATISTICS; COMPUTERIZED SIMULATION; FAULT TREE ANALYSIS; MAPPING; RELIABILITY
- Descriptors DEC
- MATHEMATICS; SIMULATION; STATISTICS; SYSTEM FAILURE ANALYSIS; SYSTEMS ANALYSIS