Effects of finite system-size and finite inhomogeneity on the conductivity of broadly distributed resistor networks
Creators
Description
Monte Carlo simulation is used to investigate the critical path calculation of the conductivity of a random resistor network that has a logarithmically broad distribution of bond conductances. It has been argued that in three dimensions the conductivity prefactor exponent y is equal to the percolation correlation length exponent ν, but past numerical computations have always found y<ν. Finite-size effects are usually blamed but have never been documented. Our analysis of Monte Carlo data also finds y<ν, but we show that the result is not due to finite-size effects. Instead, the observed y<ν is due to the effects of finite inhomogeneity. The conductivity is controlled by critical conductors, but the distance between current carrying pathways is less than presumed in the theoretical arguments that lead to y=ν. The shorter separation distance results in y<ν
Additional details
Identifiers
- DOI
- 10.1016/j.physb.2003.08.005;
- PII
- S092145260300509X;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 338
- Journal Issue
- 1-4
- Journal Page Range
- p. 266-269
- ISSN
- 0921-4526
- CODEN
- PHYBE3
Conference
- Title
- 6. international conference on electrical transport and optical properties of inhomogeneous media
- Dates
- 15-19 Jul 2002
- Place
- Snowbird, UT (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36112748
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; CORRELATIONS; DISTANCE; DISTRIBUTION; ELECTRIC CURRENTS; MONTE CARLO METHOD; RANDOMNESS; RESISTORS
- Descriptors DEC
- CALCULATION METHODS; CURRENTS; ELECTRICAL EQUIPMENT; EQUIPMENT; SIMULATION
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.