Published May 1999 | Version v1
Miscellaneous

A study on measurement of ionization radiation using a PN junction Si diode

  • 1. KAERI, Taejon (Korea, Republic of)
  • 2. Hanbat National Univ., Taejon (Korea, Republic of)

Description

For a detection of ionizing radiation using a small size PN junction Si diode, pre-amplifier design and system performance test were carried out. The pre-amplifier consists of charge sensitive operational-amplifier, clipping circuit, amplifier, and low-pass filter. Noise level and pulse amplitude created by ionizing radiation at the final output of the pre-amplifier were approximately 50mV and 200mV, respectively. and those electric signals showed the outstanding difference. As a performance test, linearity, energy dependence and relative average deviation were evaluated. The results showed that the linearity was within 2 percent and the relative energy dependence was 1.82 at the 54.2 keV and 1.23 at the 118 keV under the reference of 137Cs(662 keV). Also the relative average deviation was evaluated 2.7 percent in the maximum at the radiation dose rate(2 mR/h), but it showed decreasing trend as increasing radiation intensity

Part of:
Proceedings of the Korean Nuclear Society spring meeting

Additional details

Publishing Information

Publisher
KNS
Imprint Place
Taejon (Korea, Republic of)
Imprint Title
Proceedings of the Korean Nuclear Society spring meeting
Imprint Pagination
[one CD-ROM]
Journal Page Range
[8 p.]

Conference

Title
1999 spring meeting of the Korean Nuclear Society
Dates
28-29 May 1999
Place
Pohang (Korea, Republic of)

INIS

Country of Publication
Korea, Republic of
Country of Input or Organization
Korea, Republic of
INIS RN
33042555
Subject category
S61: RADIATION PROTECTION AND DOSIMETRY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
AMPLIFIERS; DESIGN; IONIZATION; PERFORMANCE TESTING; RADIATION DOSES; RADIATION MONITORING; SILICON DIODES
Descriptors DEC
DOSES; ELECTRONIC EQUIPMENT; EQUIPMENT; MONITORING; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TESTING

Optional Information

Notes
7refs, 6 figs, 2 tabs