Published February 2012 | Version v1
Journal article Metadata-only

Development of soft x-ray time-resolved photoemission spectroscopy system with a two-dimensional angle-resolved time-of-flight analyzer at SPring-8 BL07LSU

Creators

  • 1. Institute for Solid State Physics, University of Tokyo, 5-1-5 Kashiwanoha, Chiba 277-8581 (Japan)
  • 2. Department of Chemistry, Keio University, Yokohama 223-8522 (Japan)
  • 3. RIKEN/SPring-8 Center, 1-1-1, Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148 (Japan)

Description

We have developed a soft x-ray time-resolved photoemission spectroscopy system using synchrotron radiation (SR) at SPring-8 BL07LSU and an ultrashort pulse laser system. Two-dimensional angle-resolved measurements were performed with a time-of-flight-type analyzer. The photoemission spectroscopy system is synchronized to light pulses of SR and laser using a time control unit. The performance of the instrument is demonstrated by mapping the band structure of a Si(111) crystal over the surface Brillouin zones and observing relaxation of the surface photo-voltage effect using the pump (laser) and probe (SR) method.

Additional details

Identifiers

DOI
10.1063/1.3687428;

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
83
Journal Issue
2
Journal Page Range
p. 023109-023109.7
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44023011
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
BRILLOUIN ZONES; CRYSTALS; LASERS; OPTICAL PUMPING; PERFORMANCE; PHOTOEMISSION; PULSES; RELAXATION; SILICON; SOFT X RADIATION; SPATIAL RESOLUTION; SPRING-8 STORAGE RING; SYNCHROTRON RADIATION; TIME RESOLUTION; TIME-OF-FLIGHT METHOD; VISIBLE RADIATION; X-RAY PHOTOELECTRON SPECTROSCOPY; X-RAY SPECTROSCOPY
Descriptors DEC
BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; IONIZING RADIATIONS; PHOTOELECTRON SPECTROSCOPY; PUMPING; RADIATION SOURCES; RADIATIONS; RESOLUTION; SECONDARY EMISSION; SEMIMETALS; SPECTROSCOPY; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; TIMING PROPERTIES; X RADIATION; ZONES

Optional Information

Notes
(c) 2012 American Institute of Physics