Published June 1994
| Version v1
Journal article
Frictional and atomic-scale study of C60 thin films by scanning force microscopy
- 1. Inst. of Physics, Univ. of Basel (Switzerland)
- 2. Max Planck Inst. of Microstructure Physics, Halle (Germany)
Description
Scanning force microscopy (SFM) was employed to characterize C60 island films in an ultra-high vacuum (UHV). The initial growth stage of C60 on NaCl cleavage faces and nanotribological properties of this solid lubricant are investigated. In comparison to the NaCl(001) face, higher friction is measured on the C60 islands, resulting in a ratio of friction of 1:3 for NaCl:C60. The friction coefficient of the (111) oriented C60 island is determined to be 0.15±0.05. High-resolution SFM images reveal the hexagonal lattice of the unreconstructed (111) top surfaces and the overgrowth relationships of the C60 islands. (orig.)
Additional details
Publishing Information
- Journal Title
- Zeitschrift fuer Physik. B, Condensed Matter
- Journal Volume
- 95
- Journal Issue
- 1
- Journal Page Range
- p. 1-3.
- ISSN
- 0722-3277
- CODEN
- ZPCMDN
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 26000539
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CLEAVAGE; ELECTRON MICROSCOPY; FRICTION; FULLERENES; HEXAGONAL LATTICES; LUBRICATION; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTIES; SURFACES; THIN FILMS
- Descriptors DEC
- CARBON; CRYSTAL LATTICES; CRYSTAL STRUCTURE; ELEMENTS; FILMS; MICROSCOPY; MICROSTRUCTURE; NONMETALS