Published July 1973
| Version v1
Report
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Room temperature annealing of ionization-induced damage in CMOS circuits
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.
Files
Restricted
The record is publicly accessible, but files are restricted to users with access.
Additional details
Publishing Information
- Imprint Pagination
- 19 p.
- Report number
- SLA--73-5618
Conference
- Title
- Conference on nuclear and space radiation effects.
- Dates
- 23 Jul 1973.
- Place
- Logan, Utah, USA.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 5094852
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANNEALING; ELECTRONS; GAMMA RADIATION; LOGIC CIRCUITS; MEDIUM TEMPERATURE; MOS TRANSISTORS; PHYSICAL RADIATION EFFECTS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELECTRONIC CIRCUITS; ELEMENTARY PARTICLES; FERMIONS; HEAT TREATMENTS; LEPTONS; RADIATION EFFECTS; RADIATIONS; SEMICONDUCTOR DEVICES; TRANSISTORS
Optional Information
- Secondary number(s)
- CONF-730703--6.