Published April 2009 | Version v1
Journal article

High- and low-frequency noise in Cs and in liquid metal ion sources

  • 1. ARC Research, Functional Materials, A-2444 Seibersdorf (Austria)
  • 2. TU Vienna, Institute of Photonics, Gusshausstr. 9-12, A-1040 Vienna (Austria)
  • 3. ARC Research, Propulsion Systems, A-2444 Seibersdorf (Austria)

Description

Fundamental Physics space missions set rigid thrust noise limits for liquid metal ion thrusters used as actuators on drag-free platforms aboard the spacecraft. We have measured current-, voltage- and thrust noise of Cs and In LMIS, foreseen as prime candidates in these missions. In the high-frequency range, quasiperiodic oscillations around ∼105 Hz can be observed for both types of emitters with frequency depending on emission current. In the low-frequency range (1-10-3 Hz), which is particularly important for drag-free control, different types of noise events are observed, which in some instances show definite signs of deterministic chaos (period doubling, self-similarity). High-frequency current oscillations are generally ascribed to electro-hydrodynamic oscillations of the TAYLOR cone and the jet at its apex, with concomitant emission of charged nanodroplets. Comparison of theory and experiment shows unsatisfactory agreement in predicted vs. measured current oscillation frequencies and large disagreement in droplet emission frequencies. No theory is presently available for describing low-frequency noise events. In terms of a linearized Mair theory it is, however, shown that these noise events can be efficiently described by spontaneous variations in electrical emitter impedance. In spite of this impedance noise, the mission requirements for thrust noise (<0.1 μN/Hz1/2) can be met by a thrust-stabilized In emitter.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2008.10.026

Additional details

Identifiers

DOI
10.1016/j.ultramic.2008.10.026;
PII
S0304-3991(08)00289-1;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
109
Journal Issue
5
Journal Page Range
p. 436-441
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
51. international field emission symposium
Acronym
IFES 2008
Dates
29 Jun - 5 Jul 2008
Place
Rouen (France)

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.