Published January 15, 2009
| Version v1
Journal article
Novel chemical synthetic route and characterization of tungsten diselenide thin films
- 1. Solid State Laboratory, Department of Chemistry, Shivaji University, Kolhapur (M.S.) India (India)
- 2. Department of Chemistry, Walchand College, Solapur, (M.S.) India (India)
- 3. Department of Chemistry, KIT's College of Engineering, Kolhapur (M.S.) India (India)
- 4. Department of Chemistry, J.S.M. College, Alibag, (M.S.) India (India)
Description
Polycrystalline WSe2 semiconductor thin films were obtained by relatively simple chemical bath deposition method using the sodium tungstate, tartaric acid, hydrazine hydrate and sodium selenosulphate as a precursor sources in an aqueous alkaline medium at room temperature. Various preparative conditions of WSe2 thin films are outlined. The grown films were found to be uniform, well adherent, brown in color. The films were studied using X-ray diffraction (XRD), scanning electron microscopy (SEM), optical absorption and electrical conductivity properties. The optical study shows a direct band gap nature with band gap energy 1.48 eV, and having specific electrical conductivity of the order of 10-2 Ω-1 cm-1 showing n-type conduction mechanism
Availability note (English)
Available from http://dx.doi.org/10.1016/j.matchemphys.2008.07.040Additional details
Identifiers
- DOI
- 10.1016/j.matchemphys.2008.07.040;
- PII
- S0254-0584(08)00508-7;
Publishing Information
- Journal Title
- Materials Chemistry and Physics
- Journal Volume
- 113
- Journal Issue
- 1
- Journal Page Range
- p. 183-186
- ISSN
- 0254-0584
- CODEN
- MCHPDR
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40066922
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION; CRYSTAL STRUCTURE; DEPOSITION; ELECTRIC CONDUCTIVITY; EV RANGE 01-10; HYDRATES; HYDRAZINE; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SODIUM TUNGSTATES; TARTARIC ACID; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; TUNGSTEN SELENIDES; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CARBOXYLIC ACIDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ENERGY RANGE; EV RANGE; FILMS; HYDROXY ACIDS; MATERIALS; MICROSCOPY; NITROGEN COMPOUNDS; ORGANIC ACIDS; ORGANIC COMPOUNDS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METAL COMPOUNDS; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; SODIUM COMPOUNDS; SORPTION; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; TUNGSTATES; TUNGSTEN COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.