Published February 2013
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X-ray and Auger electron study of highly charged ions using resonant coherent excitation
- 1. RIKEN, Atomic, Molecular and Optical Physics Laboratory, Wako, Saitama (Japan)
- 2. Tokyo University of Agriculture and Technology, Department of Applied Physics, Fuchu, Tokyo (Japan)
- 3. RIKEN Nishina Center, Wako, Saitama (Japan)
- 4. Tokyo University, Graduate School of Arts and Sciences, Tokyo (Japan)
- 5. National Institute of Radiological Sciences, Chiba, Chiba (Japan)
Description
We observed X-ray and Auger electron emissions following the three-dimensional resonant coherent excitation (3D-RCE) of highly charged ions in a Si crystal. Using the polarization control technique, the ions were excited to the specific magnetic substates resulting in anisotropic emissions of de-excitation x-rays. The Auger electron emission was also observed through the selective production of doubly excited states by the double resonance technique in 3D-RCE. These methods are quite useful to study the collision dynamics, decay properties, and structure of highly charged ions relevant to atomic processes in plasma. (author)
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Additional details
Publishing Information
- Imprint Title
- JSPS-NRF-NSFC A3 foresight program seminar. Proceedings of Japan-China joint seminar on atomic and molecular processes in plasma
- Imprint Pagination
- 154 p.
- Journal Page Range
- p. 87-92
- Report number
- NIFS-PROC--91
Conference
- Title
- 4. Japan-China joint seminar on atomic and molecular processes in plasma
- Acronym
- AMPP2012
- Dates
- 30 Jul - 4 Aug 2012
- Place
- Lanzhou (China)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 48007448
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATORS; AUGER ELECTRON SPECTROSCOPY; CRYSTALS; EXCITATION; EXCITED STATES; HEAVY IONS; LASERS; LATTICE PARAMETERS; LORENTZ FORCE; MULTICHARGED IONS; OSCILLATIONS; POLARIZATION; RESONANCE; SI SEMICONDUCTOR DETECTORS; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; ELECTRON SPECTROSCOPY; ENERGY LEVELS; ENERGY-LEVEL TRANSITIONS; IONS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY
Optional Information
- Notes
- 11 refs., 3 figs.