Published October 2005
| Version v1
Journal article
Degradation of PET, PEEK and PI induced by irradiation with 150 keV Ar+ and 1.76 MeV He+ ions
Creators
- 1. Nuclear Physics Institute, Academy of Sciences of the Czech Republic, 250 68 Rez (Czech Republic)
- 2. Department of Solid State Engineering, Institute of Chemical Technology, 166 28 Prague (Czech Republic)
- 3. High Energy Accelerator Research Organization (KEK), Oho, Tsukuba, Ibaraki 305-0801 (Japan)
Description
In this work, PET was implanted with 150 keV Ar+ ions to the fluences of 1012-1015 ions/cm2, PET, PEEK and PI with 1.76 MeV 4He+ ions to the fluences 1013-1014 ions/cm2. Structural and compositional alterations of the implanted polymers were studied using Rutherford back-scattering (RBS), elastic recoil detection analysis (ERDA), ultra-violet and visible light spectroscopy (UV-VIS) and positron annihilation spectroscopy (PAS). The formation of a new bonds in modified polymer films are detected in proportion to the used ion dose using UV-VIS spectroscopy. For Ar+ ions and higher fluences a decline in hydrogen and oxygen content is observed
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2005.06.124;
- PII
- S0168-583X(05)01077-3;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 240
- Journal Issue
- 1-2
- Journal Page Range
- p. 245-249
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 8. European conference on accelerators in applied research and technology
- Acronym
- ECAART-8
- Dates
- 20-24 Sep 2004
- Place
- Paris (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37027024
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; BACKSCATTERING; FILMS; HELIUM IONS; HYDROGEN; ION BEAMS; IRRADIATION; KEV RANGE 100-1000; MEV RANGE 01-10; OXYGEN; POLYMERS; RECOILS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; VISIBLE RADIATION
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELEMENTS; ENERGY RANGE; IONS; KEV RANGE; MEV RANGE; NONMETALS; RADIATIONS; SCATTERING; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.