Published April 1, 2017 | Version v1
Journal article

Increase of photogenerated carriers in thick quantum wells in InGaN solar cells verified by laser-assisted capacitance-voltage measurement

  • 1. State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083 (China)
  • 2. Engineering Research Center of New Energy Storage Devices and Applications, Chongqing University of Arts and Sciences, Chongqing 402160 (China)
  • 3. Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou 215125 (China)
  • 4. Microsystem and Terahertz Research Center, Chinese Academy of Engineering Physics, Chengdu 610200 (China)

Description

For the InGaN/GaN multiple quantum well (MQW) solar cells, it is known that in the thicker InGaN QWs the collection of photogenerated carriers suffer from the impact of both stronger piezoelectric field and enhanced non-radiative recombination process, which may lead to an inferior performance for thick-well solar cells. However, we find that the photovoltaic intensities of our MQW solar cells with different well thickness are almost the same. Combined with the profiles of apparent carrier concentration obtained from the capacitance-voltage measurement with additional laser illumination, we conclude that the increase of photogenerated carriers in the thick QWs may partially counteract the adverse effects of both polarization effect and deteriorated material quality on the photocurrent for the MQW solar cells with thick InGaN well layers, compared with the thin-well ones. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/2053-1591/aa6bcb

Additional details

Identifiers

Publishing Information

Journal Title
Materials Research Express (Online)
Journal Volume
4
Journal Issue
4
Journal Page Range
[8 p.]
ISSN
2053-1591