Multi-frequency simultaneous measurement of bioimpedance spectroscopy based on a low crest factor multisine excitation
- 1. Department of Precision Instrumentation Engineering, Xi'an University of Technology, Xi'an, People's Republic of China (China)
- 2. Department of Instrumentation Science and Technology, Hunan University, Changsha, People's Republic of China (China)
Description
Bioimpedance spectroscopy (BIS) is becoming a powerful diagnostic tool for a wide variety of medical applications, and the multi-frequency simultaneous (MFS) measurement of BIS can greatly reduce measurement time and record the transient physiological status of a living body compared with traditional frequency-sweep measurement technology. This paper adopts the Van der Ouderaa's multisine, which has 31 equidistant and flat amplitude spectra and a low crest factor of 1.405 as the broadband excitation, and realizes the MFS measurement of BIS by means of spectral analysis using the fast Fourier transform algorithm. The approach to implement the multisine based on a field-programmable gate array and a digital to analog converter is described in detail, and impedance measurement experiments are performed on three resistance-capitance three-element phantoms. Experimental results show a commendable accuracy with a mean relative error of 0.55% for the impedance amplitudes, and a mean absolute error of 0.20° for the impedance phases on the 31 frequencies ranging linearly from 32 to 992 kHz. This paper validates the feasibility of the MFS technology for BIS measurement based on the multisine excitation. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0967-3334/36/3/489Additional details
Identifiers
Publishing Information
- Journal Title
- Physiological Measurement (Print)
- Journal Volume
- 36
- Journal Issue
- 3
- Journal Page Range
- p. 489-501
- ISSN
- 0967-3334
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47054163
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; AMPLITUDES; COMPARATIVE EVALUATIONS; DIAGNOSTIC TECHNIQUES; DIGITAL-TO-ANALOG CONVERTERS; ERRORS; EXCITATION; FOURIER TRANSFORMATION; IMPEDANCE; KHZ RANGE 01-100; PHANTOMS; SPECTRA; SPECTROSCOPY
- Descriptors DEC
- ELECTRONIC EQUIPMENT; ENERGY-LEVEL TRANSITIONS; EQUIPMENT; EVALUATION; FREQUENCY RANGE; INTEGRAL TRANSFORMATIONS; KHZ RANGE; MATHEMATICAL LOGIC; MOCKUP; STRUCTURAL MODELS; TRANSFORMATIONS