Capacitance and photoelectrochemical studies for the assessment of anodic oxide films on aluminium
Creators
- 1. Department of Chemical Engineering, Instituto Superior Tecnico, 1049-001 Lisbon (Portugal)
- 2. Instituto Superior de Eng. de Lisboa, Department of Mechanical Engineering, 1950-062 Lisbon (Portugal)
- 3. Department of Ceramics and Glass Engineering, University of Aveiro, 3810-193 Aveiro (Portugal)
- 4. CECUL, Faculty of Sciences, University of Lisbon, 1749-016 Lisbon (Portugal)
Description
Photoelectrochemical spectroscopy and capacitance measurements were used in this work to assess the electronic properties of the oxide films formed on 99.5% aluminium and 2024-T3 aluminium alloy by anodising in a sulphuric-boric bath. The morphology of these films was also studied by transmission electron microscopy cross-section observations. The results obtained indicate that the oxide films formed on aluminium show a n-type semiconductive behaviour, with bandgap energies that are identical for the oxides studied, despite their different characteristics. It was found out that capacitance measurements may be used as a valuable technique for the assessment of the quality of anodised layers, allowing the distinction between an efficient and an inefficient sealing. Therefore, they may be used to predict the corrosion resistance of these materials
Additional details
Identifiers
- DOI
- 10.1016/j.electacta.2004.05.025;
- PII
- S0013-4686(04)00537-7;
Publishing Information
- Journal Title
- Electrochimica Acta
- Journal Volume
- 49
- Journal Issue
- 26
- Journal Page Range
- p. 4701-4707
- ISSN
- 0013-4686
- CODEN
- ELCAAV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37047408
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM; ALUMINIUM ALLOYS; CAPACITANCE; CORROSION RESISTANCE; CROSS SECTIONS; ELECTROCHEMISTRY; FILMS; LAYERS; MORPHOLOGY; OXIDES; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; CHALCOGENIDES; CHEMISTRY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.