Published October 15, 2004 | Version v1
Journal article

Capacitance and photoelectrochemical studies for the assessment of anodic oxide films on aluminium

  • 1. Department of Chemical Engineering, Instituto Superior Tecnico, 1049-001 Lisbon (Portugal)
  • 2. Instituto Superior de Eng. de Lisboa, Department of Mechanical Engineering, 1950-062 Lisbon (Portugal)
  • 3. Department of Ceramics and Glass Engineering, University of Aveiro, 3810-193 Aveiro (Portugal)
  • 4. CECUL, Faculty of Sciences, University of Lisbon, 1749-016 Lisbon (Portugal)

Description

Photoelectrochemical spectroscopy and capacitance measurements were used in this work to assess the electronic properties of the oxide films formed on 99.5% aluminium and 2024-T3 aluminium alloy by anodising in a sulphuric-boric bath. The morphology of these films was also studied by transmission electron microscopy cross-section observations. The results obtained indicate that the oxide films formed on aluminium show a n-type semiconductive behaviour, with bandgap energies that are identical for the oxides studied, despite their different characteristics. It was found out that capacitance measurements may be used as a valuable technique for the assessment of the quality of anodised layers, allowing the distinction between an efficient and an inefficient sealing. Therefore, they may be used to predict the corrosion resistance of these materials

Additional details

Identifiers

DOI
10.1016/j.electacta.2004.05.025;
PII
S0013-4686(04)00537-7;

Publishing Information

Journal Title
Electrochimica Acta
Journal Volume
49
Journal Issue
26
Journal Page Range
p. 4701-4707
ISSN
0013-4686
CODEN
ELCAAV

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37047408
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINIUM; ALUMINIUM ALLOYS; CAPACITANCE; CORROSION RESISTANCE; CROSS SECTIONS; ELECTROCHEMISTRY; FILMS; LAYERS; MORPHOLOGY; OXIDES; SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ALLOYS; CHALCOGENIDES; CHEMISTRY; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES

Optional Information

Copyright
Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.