Electron self-injection in the proton-driven-plasma-wakefield acceleration
Creators
- 1. School of Physics and Optoelectronic Technology, Dalian University of Technology, Dalian 116024 (China)
Description
The self-injection process of plasma electrons in the proton-driven-plasma-wakefield acceleration scheme is investigated using a two-dimensional, electromagnetic particle-in-cell method. Plasma electrons are self-injected into the back of the first acceleration bucket during the initial bubble formation period, where the wake phase velocity is low enough to trap sufficient electrons. Most of the self-injected electrons are initially located within a distance of the skin depth c/ωpe to the beam axis. A decrease (or increase) in the beam radius (or length) leads to a significant reduction in the total charges of self-injected electron bunch. Compared to the uniform plasma, the energy spread, emittance and total charges of the self-injected bunch are reduced in the plasma channel case, due to a reduced injection of plasma electrons that initially located further away from the beam axis
Additional details
Identifiers
- DOI
- 10.1063/1.4848738;
Publishing Information
- Journal Title
- Physics of Plasmas
- Journal Volume
- 20
- Journal Issue
- 12
- Journal Page Range
- p. 123109-123109.7
- ISSN
- 1070-664X
- CODEN
- PHPAEN
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45039330
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Descriptors DEI
- ACCELERATION; BEAM BUNCHING; COMPARATIVE EVALUATIONS; ELECTRONS; PHASE VELOCITY; PLASMA; PLASMA BEAM INJECTION; PLASMA GUNS; PLASMA SIMULATION; PROTONS; TRAPS; TWO-DIMENSIONAL CALCULATIONS; WAKEFIELD ACCELERATORS
- Descriptors DEC
- ACCELERATORS; BARYONS; BEAM DYNAMICS; BEAM INJECTION; DYNAMICS; ELEMENTARY PARTICLES; EVALUATION; FERMIONS; HADRONS; LEPTONS; LINEAR ACCELERATORS; MECHANICS; NUCLEONS; SIMULATION; VELOCITY
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC