Published 1997
| Version v1
Book
Physical foundations of electron microscopy
Creators
Description
The following topics were dealt with: Physical foundations, dynamic theory of diffraction contrasts, dynamic theory of electron diffraction, electron diffraction on crystals with defects, high-resolution electron microscopy, analytical electron microscopy
Additional details
Additional titles
- Original title (German)
- Physikalische Grundlagen der Elektronenmikroskopie
Publishing Information
- Publisher
- Teubner.
- Imprint Place
- Stuttgart (Germany)
- ISBN
- 3-519-03221-X
- Imprint Pagination
- 320 p.
- Series
- Teubner Studienbuecher: Angewandte Physik.
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 29003240
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- EDUCATION; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; MANUALS
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; DOCUMENT TYPES; MICROSCOPY; SCATTERING