Published January 1975 | Version v1
Journal article

Integrated circuit pile-up rejector

Creators

  • 1. Naval Research Lab., Washington, DC

Description

The pile−up circuit described has been tested at random rates to 80 000 pps with a pulse pair resolution of 20 nsec. The unit features integrated circuits for decision−making logic.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
46
Journal Issue
1
Series
Rev. Sci. Instrum.
Journal Page Range
102-103
ISSN
0034-6748

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
6185684
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract
Descriptors DEI
COUNTING CIRCUITS; INTEGRATED CIRCUITS; PULSE CIRCUITS; PULSE PILEUP; RADIATION DETECTORS
Descriptors DEC
ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS

Optional Information

Notes
Published in summary form only.; Updated automatically by Metadata and Full-Text Enrichment Agent