Published January 1975
| Version v1
Journal article
Integrated circuit pile-up rejector
Description
The pile−up circuit described has been tested at random rates to 80 000 pps with a pulse pair resolution of 20 nsec. The unit features integrated circuits for decision−making logic.
Additional details
Identifiers
- DOI
- 10.1063/1.1134042;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 46
- Journal Issue
- 1
- Series
- Rev. Sci. Instrum.
- Journal Page Range
- 102-103
- ISSN
- 0034-6748
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 6185684
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- COUNTING CIRCUITS; INTEGRATED CIRCUITS; PULSE CIRCUITS; PULSE PILEUP; RADIATION DETECTORS
- Descriptors DEC
- ELECTRONIC CIRCUITS; MEASURING INSTRUMENTS
Optional Information
- Notes
- Published in summary form only.; Updated automatically by Metadata and Full-Text Enrichment Agent