Microstructural characterization of Al-7075-T651 chips and work pieces produced by high-speed machining
- 1. National Institute of Standards and Technology, Metallurgy Division, Materials Science and Engineering Laboratory, Gaithersburg, MD 20899 (United States)
- 2. National Institute of Standards and Technology, Manufacturing Metrology Division, Manufacturing Engineering Laboratory, Gaithersburg, MD 20899 (United States)
Description
High-speed orthogonal machining produced a series of Al-7075-T651 chips and work pieces for microstructural charcterization. The orthogonal machining conditions included two rake angles, three cuttings speeds, and a constant feed rate. The chips and work pieces were characterized using optical metallography, transmission electron microscopy (TEM), and microhardness measurements. TEM observations indicated growth of the η' precipitates and showed recrystallized equiaxed grains within the shear bands of the chips. Microhardness profiles of the work pieces showed a decrease in hardness at the work surface. The thickness of this deformation layer increased with cutting speed. Microstructural characterizations were correlated with calculated temperature-time profiles to investigate possible mechanisms for the observed microstructure changes
Additional details
Identifiers
- DOI
- 10.1016/j.msea.2006.04.122;
- PII
- S0921-5093(06)00524-7;
Publishing Information
- Journal Title
- Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing
- Journal Volume
- 430
- Journal Issue
- 1-2
- Journal Page Range
- p. 15-26
- ISSN
- 0921-5093
- CODEN
- MSAPE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38079391
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; CUTTING; DEFORMATION; GRAIN GROWTH; LAYERS; METALLOGRAPHY; MICROHARDNESS; MICROSTRUCTURE; PRECIPITATION; SHEAR; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ALLOYS; DIMENSIONS; ELECTRON MICROSCOPY; HARDNESS; MACHINING; MECHANICAL PROPERTIES; MICROSCOPY; SEPARATION PROCESSES
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.