Fourier transform (FT) - EPR spectroscopy on neutron irradiated silica fiber tubes
Description
The electron spin echo spectra of neutron irradiated silica fiber tubes were recorded at 2 and 9.5 GHz. Three signals were detected in these samples attributed to the E'1-center, E'1-center interacting with hydrogen atom, and 29Si-E'1-center. The relaxation times T1 and T2 for these defects were determined at 2 and 9.5 GHz. The T2 was independent of the temperature down to 110 K and then increased with the decrease of the temperature of measurements. The T1 relaxation time of the 28Si and 29Si E' center were the same within the errors of measurements down to 35 K and followed the same dependence on T. The T1 vs. T curves were simulated using a superposition of three different relaxation mechanisms. A Fourier Transform EPR spectrum was derived from the ESEEM pattern. The ESEEM pattern was simulated in order to extract the structure of the E' center
Additional details
Publishing Information
- Publisher
- American Ceramic Society Inc.
- Imprint Place
- Columbus, OH (United States)
- Imprint Title
- 93rd Annual Meeting and Exposition. Abstracts
- Imprint Pagination
- 476 p.
- Journal Page Range
- p. 470.
Conference
- Title
- 93. annual meeting and exposition of the American Ceramic Society (ACerS).
- Dates
- 28 Apr - 2 May 1991.
- Place
- Cincinnati, OH (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 24022156
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- E CENTERS; ELECTRON SPIN RESONANCE; FIBERS; FOURIER TRANSFORMATION; NMR SPECTRA; PHYSICAL RADIATION EFFECTS; SILICON OXIDES; SPECTROSCOPY; SPIN ECHO; TUBES
- Descriptors DEC
- CHALCOGENIDES; COLOR CENTERS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; INTEGRAL TRANSFORMATIONS; MAGNETIC RESONANCE; OXIDES; OXYGEN COMPOUNDS; POINT DEFECTS; RADIATION EFFECTS; RESONANCE; SILICON COMPOUNDS; SPECTRA; TRANSFORMATIONS; VACANCIES
Optional Information
- Secondary number(s)
- CONF-910430--.