X-ray micro diffraction. Part 1. KOSSEL technique

There are world-wide efforts to analyze micro regions of compact samples by means of X-ray diffraction. Two micro diffraction procedures, the KOSSEL technique (part 1) excited by electron or synchrotron radiation beams and the new X-ray Rotation-Tilt Method (part 2), are compared to show their possibilities and limitations. These techniques can be applied to a wide range of analytical problems in materials diagnostics, e.g.: high-accuracy determination of crystallographic orientations, dislocation density determination, determination of decrease in symmetry, high-accuracy determination of lattice constants, precision determination of residual stresses of the second and the third kind as well as phase identification in micro regions. Some selected examples are presented. (orig.)