Studies on the extraction region of the type VI RF driven H-ion source
Creators
- 1. Max-Planck-Institut fuer Plasmaphysik, EURATOM Association, Boltzmannstrasse 2, Garching, D-85748 (Germany)
Description
IPP Garching has spent several years developing a RF driven H-ion source intended to be an alternative to the current ITER (International Thermonuclear Experimental Reactor) reference design ion source. A RF driven source offers a number of advantages to ITER in terms of reduced costs and maintenance requirements. Although the RF driven ion source has shown itself to be competitive with a standard arc filament ion source for positive ions many questions still remain on the physics behind the production of the H- ion beam extracted from the source. With the improvements that have been implemented to the BATMAN (Bavarian Test Machine for Negative Ions) facility over the last two years it is now possible to study both the extracted ion beam and the plasma in the vicinity of the extraction grid in greater detail. This paper will show the effect of changing the extraction and acceleration voltage on both the current and shape of the beam as measured on the calorimeter some 1.5 m downstream from the source. The extraction voltage required to operate in the plasma limit is 3 kV. The perveance optimum for the extraction system was determined to be 2.2 x 10-6 A/V3/2 and occurs at 2.7 kV extraction voltage. The horizontal and vertical beam half widths vary as a function of the extracted ion current and the horizontal half width is generally smaller than the vertical. The effect of reducing the co-extracted electron current via plasma grid biasing on the H- current extractable and the beam profile from the source is shown. It is possible in the case of a silver contaminated plasma to reduce the co-extracted electron current to 20% of the initial value by applying a bias of 12 V. In the case where argon is present in the plasma, biasing is observed to have minimal effect on the beam half width but in a pure hydrogen plasma the beam half width increases as the bias voltage increases. New Langmuir probe studies that have been carried out parallel to the plasma grid (in the vicinity of the peak of the external magnetic filter field) and changes to source parameters as a function of power, and argon addition are reported. The behaviour of the electron density is different when the plasma is argon seeded showing a strong increase with RF power. The plasma potential is decreased by 2 V when argon is added to the plasma. The effect of the presence of unwanted silver sputtered from the Faraday screen by Ar+ ions on both the source performance and the plasma parameters is also presented. The silver dramatically downgraded source performance in terms of current density and produced an early saturation of current with applied RF power. Recently, collaboration was begun with the Technical University of Augsburg to perform spectroscopic measurements on the Type VI ion source. The final results of this analysis are not yet ready but some interesting initial observations on the gas temperature, disassociation degree and impurity ions will be presented
Additional details
Identifiers
- DOI
- 10.1063/1.1517910;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 639
- Journal Issue
- 1
- Journal Page Range
- p. 90-111
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 9. international symposium on the production and neutralization of negative ions and beams
- Dates
- 30-31 May 2002
- Place
- Gif-sur-Yvette (France)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35087331
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANIONS; ARGON; BEAM EXTRACTION; BEAM PROFILES; CALORIMETERS; CATIONS; CURRENT DENSITY; ELECTRON DENSITY; HYDROGEN IONS; ION BEAMS; ION SOURCES; IPP GARCHING; ITER TOKAMAK; LANGMUIR PROBE; MAGNETIC FILTERS; PLASMA; PLASMA POTENTIAL; PLASMA PRODUCTION; RF SYSTEMS; SILVER
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CLOSED PLASMA DEVICES; ELECTRIC POTENTIAL; ELECTRIC PROBES; ELEMENTS; FILTERS; FLUIDS; GASES; GERMAN FR ORGANIZATIONS; IONS; MEASURING INSTRUMENTS; METALS; NATIONAL ORGANIZATIONS; NONMETALS; PROBES; RARE GASES; THERMONUCLEAR DEVICES; THERMONUCLEAR REACTORS; TOKAMAK DEVICES; TOKAMAK TYPE REACTORS; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2002 American Institute of Physics