Published August 2009 | Version v1
Journal article Metadata-only

Scattering correction of X-ray thickness gauge

Creators

  • 1. Institute of Nuclear and New Energy Technology, Tsinghua Univ., Beijing (China)

Description

X-ray thickness gauge is a key device for thickness control of the steel plate on the steel mill's rolling line,and high precision is demanded. X-ray's scattering is an important factor to affect its precision. The scattering data were measured and analyzed, and its law was concluded by method of mathematic fitting. The scattering influence is corrected according to the law and the error caused by scattering is eliminated effectively. (authors)

Additional details

Publishing Information

Journal Title
Atomic Energy Science and Technology
Journal Volume
43
Journal Issue
8
Journal Page Range
p. 766-768
ISSN
1000-6931

INIS

Country of Publication
China
Country of Input or Organization
China
INIS RN
42073220
Subject category
S07: ISOTOPES AND RADIATION SOURCES;
Descriptors DEI
ACCURACY; CONTROL; CORRECTIONS; EQUIPMENT; ERRORS; PLATES; RADIATION SCATTERING ANALYSIS; ROLLING; STEELS; THICKNESS; THICKNESS GAGES; X RADIATION
Descriptors DEC
ALLOYS; CARBON ADDITIONS; CHEMICAL ANALYSIS; DIMENSIONS; ELECTROMAGNETIC RADIATION; FABRICATION; IONIZING RADIATIONS; IRON ALLOYS; IRON BASE ALLOYS; MATERIALS WORKING; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; TRANSITION ELEMENT ALLOYS

Optional Information

Notes
6 figs., 3 refs.