Published December 4, 2013 | Version v1
Journal article

GaP ring-like nanostructures on GaAs (100) with In0.15Ga0.85As compensation layers

  • 1. Semiconductor Device Research Laboratory (Nanotec Center of Excellence) Department of Electrical Engineering, Faculty of Engineering, Chulalongkorn University, Bangkok, 10330 (Thailand)

Description

We present the fabrication of GaP ring-like nanostructures on GaAs (100) substrates with inserted In0.15Ga0.85As compensation layers. The samples are grown by droplet epitaxy using solid-source molecular beam epitaxy. The dependency of nanostructural and optical properties of GaP nanostructures on In0.15Ga0.85As layer thickness is investigated by ex-situ atomic force microscope (AFM) and photoluminescence (PL). It is found that the characteristics of GaP ring-like structures on GaAs strongly depend on the In0.15Ga0.85As layer thickness

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Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1566
Journal Issue
1
Journal Page Range
p. 455-456
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
31. international conference on the physics of semiconductors
Acronym
ICPS 2012
Dates
29 Jul - 3 Aug 2012
Place
Zurich (Switzerland)

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