Tandem-phase zone-plate optics for high-energy x-ray focusing
Creators
- 1. Univ. of Hyogo, Graduate School of Materials Science, Kamigori, Hyogo (Japan)
Description
An optical system consisting of two phase zone plates closely arranged in tandem was constructed for focusing high-energy X-rays. The phase zone plates were made from tantalum and their combined thickness was 4.8 μm. An ideal diffraction efficiency of 30% is expected at 30 keV, which is about 3 times higher than that of a single zone plate. The focusing properties at 30 keV were studied both numerically and experimentally. The coaxial tandem arrangement was precisely achieved by observing Young's interference patterns in the far-field produced by the two point foci. A focus size of ∼4 μm was obtained. The photon flux density was 2.2 x1013 photons/s/mm2, which is 2.4 and 85 times higher than that obtained with a single zone plate and without focusing, respectively. The focused beam was used for scanning X-ray fluorescence microscopy and the residual tin distribution on a float glass surface was imaged. (author)
Availability note (English)
Available from http://dx.doi.org/10.1143/JJAP.50.022503Additional details
Identifiers
Publishing Information
- Journal Title
- Japanese Journal of Applied Physics
- Journal Volume
- 50
- Journal Issue
- 2
- Journal Page Range
- p. 022503.1-022503.5
- ISSN
- 0021-4922
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 42095425
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- FOCUSING; HARD X RADIATION; INTERFERENCE; OPTICAL SYSTEMS; PLATES; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION; TANTALUM; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ELEMENTS; IONIZING RADIATIONS; METALS; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATIONS; REFRACTORY METALS; RESOLUTION; SCATTERING; TRANSITION ELEMENTS; X RADIATION; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 17 refs., 9 figs., 2 tabs.