Published 1991 | Version v1
Journal article

Lanthanide (Yb, Er, Tm, Pr, Ho) and actinide (U) activated luminescence in III-V semiconductors

  • 1. Air Force Office of Scientific Research, Washington, DC (United States)
  • 2. Air Force Inst. of Techn. Wright-Patterson A.F.B., OH (United States)

Description

Through photoluminescence the characteristic 4f- and 5f-emissions in the 0.9 to 1.7 μm spectral range were investigated in lanthanide and actinide implanted binary and ternary III-V semiconductors. The resulting sharp emissions were seen around 1.0 μm for Yb3+ in InP, GaP, and AlGaAs; 1.5 μm for Er3+ in GaAs, InP, GaP, AlAs, and AlGaAs of four different Al mole fractions; 1.2 μm for Tm3+ in GaAs and InP; 1.1, 1.3, and 1.6 μm for Pr3+ in GaAs and 1.3 μm for Pr3+ in InP; 0.9 and 1.1 μm for Ho3+ in GaAs; and from 1.6 to 1.7 μm for U in GaAs, InP, and AlGaAs

Additional details

Publishing Information

Journal Title
European Journal of Solid State and Inorganic Chemistry
Journal Volume
28
Journal Issue
Suppl
Series
Eur. J. Solid State Inorg. Chem.
Journal Page Range
159-162
CODEN
EJSCE

Conference

Title
Conference on New Developments in f-Elements.
Dates
4-7 Sep 1990.
Place
Leuven (Belgium).