Published November 2010 | Version v1
Journal article

Analog-to-digital conversion for low-frequency waveforms based on the Josephson voltage standard

  • 1. Korea Research Institute of Standards and Science, 1 Doryong-Dong, Yuseong-Gu, Daejeon 305-340 (Korea, Republic of)

Description

A waveform synthesizer adopting a superconductor–normal metal–superconductor junction array has been developed, which can generate arbitrary stepwise waveforms with a number of quantum-voltage steps up to 1 V level amplitude. As an application of the synthesizer, we have built a sampling voltmeter that measures the differential voltages between a sinusoidal waveform produced by a semiconductor-based ac source and the Josephson waveforms. We carried out extensive sampling measurements for a 50 Hz sine wave with 1 V amplitude, applying sampling apertures in the range of 55 µs ≤ta ≤ 130 µs and using Josephson waveforms with 32, 60, 80 and 100 quantum steps. From the measurements, the amplitude of the ac waveform was determined with a type A uncertainty (k = 2) of 0.15 µV. Also, we elucidated how the phase jitter in the ac waveform is reflected in the overall uncertainty for the measurements. The type B uncertainty due to the jitter is at least one order of magnitude smaller than the type A uncertainty

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-0233/21/11/115102

Additional details

Identifiers

DOI
10.1088/0957-0233/21/11/115102;
PII
S0957-0233(10)53379-4;

Publishing Information

Journal Title
Measurement Science and Technology
Journal Volume
21
Journal Issue
11
Journal Page Range
[6 p.]
ISSN
0957-0233
CODEN
MSTCEP

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45005274
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
AMPLITUDES; ELECTRIC POTENTIAL; SAMPLING; SEMICONDUCTOR MATERIALS; VOLTMETERS; WAVE FORMS
Descriptors DEC
ELECTRIC MEASURING INSTRUMENTS; ELECTRICAL EQUIPMENT; EQUIPMENT; MATERIALS; MEASURING INSTRUMENTS