Analog-to-digital conversion for low-frequency waveforms based on the Josephson voltage standard
- 1. Korea Research Institute of Standards and Science, 1 Doryong-Dong, Yuseong-Gu, Daejeon 305-340 (Korea, Republic of)
Description
A waveform synthesizer adopting a superconductor–normal metal–superconductor junction array has been developed, which can generate arbitrary stepwise waveforms with a number of quantum-voltage steps up to 1 V level amplitude. As an application of the synthesizer, we have built a sampling voltmeter that measures the differential voltages between a sinusoidal waveform produced by a semiconductor-based ac source and the Josephson waveforms. We carried out extensive sampling measurements for a 50 Hz sine wave with 1 V amplitude, applying sampling apertures in the range of 55 µs ≤ta ≤ 130 µs and using Josephson waveforms with 32, 60, 80 and 100 quantum steps. From the measurements, the amplitude of the ac waveform was determined with a type A uncertainty (k = 2) of 0.15 µV. Also, we elucidated how the phase jitter in the ac waveform is reflected in the overall uncertainty for the measurements. The type B uncertainty due to the jitter is at least one order of magnitude smaller than the type A uncertainty
Availability note (English)
Available from http://dx.doi.org/10.1088/0957-0233/21/11/115102Additional details
Identifiers
- DOI
- 10.1088/0957-0233/21/11/115102;
- PII
- S0957-0233(10)53379-4;
Publishing Information
- Journal Title
- Measurement Science and Technology
- Journal Volume
- 21
- Journal Issue
- 11
- Journal Page Range
- [6 p.]
- ISSN
- 0957-0233
- CODEN
- MSTCEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45005274
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- AMPLITUDES; ELECTRIC POTENTIAL; SAMPLING; SEMICONDUCTOR MATERIALS; VOLTMETERS; WAVE FORMS
- Descriptors DEC
- ELECTRIC MEASURING INSTRUMENTS; ELECTRICAL EQUIPMENT; EQUIPMENT; MATERIALS; MEASURING INSTRUMENTS