Published December 31, 2003 | Version v1
Journal article

The different behavior of nitrogen and phosphorus as n-type dopants in SiC

Description

In this work, the experimentally observed differences in the behavior of nitrogen and phosphorus as n-type dopants in silicon carbide have been investigated within the framework of density functional theory. A key to the understanding of complex formation is the investigation of the dynamics of these dopant atoms. We have found essential differences in the recombination behavior of nitrogen and phosphorus atoms with vacancies. In contrast to nitrogen, which prefers to be built in on the carbon site exclusively (NC), our dynamical calculations show phosphorus to be built in on both substitutional lattice sites (PSi and PC). By this, PC-containing complexes should be considered as possible candidates for P-related electron paramagnetic resonance spectra in 6H-SiC which up to now have not been explained consistently. Furthermore, we explain why the formation of inactive complexes is likely in case of nitrogen but not in case of phosphorus

Additional details

Identifiers

DOI
10.1016/j.physb.2003.09.234;
PII
S0921452603006677;

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
340-342
Journal Issue
3-4
Journal Page Range
p. 184-189
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
22. international conference on defects in semiconductors
Dates
28 Jul - 1 Aug 2003
Place
Aarhus (Denmark)

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.