Published September 21, 2007
| Version v1
Journal article
Highly charged ion X-rays from Electron-Cyclotron Resonance Ion Sources
Creators
- 1. Laboratoire Kastler Brossel, Ecole Normale Superieure, CNRS et Universite Pierre et Marie Curie-Paris 6, Case 74, 4 place Jussieu, 75005 Paris (France)
- 2. Department of Physics, Coimbra University, P-3000 Coimbra (Portugal)
- 3. Institut fuer Kernphysik, Forschungszentrum Juelich, D-52425 Juelich (Germany)
- 4. Institut fuer Mittelenergiephysik, Austrian Academy of Science, Vienna (Austria)
- 5. Paul Scherrer Institut, Villigen PSI, CH5232 Villigen (Switzerland)
Description
Radiation from the highly charged ions contained in the plasma of Electron-Cyclotron Resonance Ion Sources (ECRISs) constitutes a very bright source of X-rays. Because the ions have a relatively low kinetic energy (∼1eV) transitions can be very narrow, containing only a small Doppler broadening. We describe preliminary accurate measurements of two and three-electron ions with Z=16-18. We show how these measurement can test sensitively many-body relativistic calculations or can be used as X-ray standards for precise measurements of X-ray transitions in exotic atoms
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2007.05.011Additional details
Identifiers
- DOI
- 10.1016/j.nima.2007.05.011;
- arXiv
- arXiv:physics/0610264v1;
- PII
- S0168-9002(07)00849-2;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 580
- Journal Issue
- 1
- Journal Page Range
- p. 8-13
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 10. international symposium on radiation physics
- Acronym
- ISRP 10
- Dates
- 17-22 Sep 2006
- Place
- Coimbra (Portugal)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39061028
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DOPPLER BROADENING; ECR ION SOURCES; ELECTRONS; HADRONIC ATOMS; IONS; KINETIC ENERGY; MANY-BODY PROBLEM; RELATIVISTIC RANGE; X RADIATION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ATOMS; CHARGED PARTICLES; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; ENERGY; ENERGY RANGE; FERMIONS; ION SOURCES; IONIZING RADIATIONS; LEPTONS; LINE BROADENING; RADIATIONS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.