Published August 1, 2016
| Version v1
Journal article
Study of Li+ conduction in Li1.3Al0.3−xScxTi1.7(PO4)3 (x=0.01, 0.03, 0.05 and 0.07) NASICON ceramic compound
Creators
Description
Li1.3Al0.3−xScxTi1.7(PO4)3 (LASTP) (for concentrations x=0.01, 0.03, 0.05 and 0.07) system was prepared using solid state reaction. These ceramic samples were characterized using X-ray diffraction, EDX, SEM, density and DTA–TGA measurements. The electrical properties were studied in the frequency range of 20 MHz to 1 Hz and in the temperature range 303–423 K, using the impedance spectroscopy. The effect of systematic variation of scandium in the LATP lattice has been investigated. The formation of impurity phases has been discussed and found to be detrimental for Li+ conductivity. The non Debye behavior observed in modulus spectra is attributed to local inhomogeneities and impurity phases.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2016.04.027Additional details
Identifiers
- DOI
- 10.1016/j.physb.2016.04.027;
- PII
- S0921-4526(16)30147-8;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 494
- Journal Page Range
- p. 20-25
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48012121
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CERAMICS; DIFFERENTIAL THERMAL ANALYSIS; ELECTRICAL PROPERTIES; GRAIN BOUNDARIES; IMPURITIES; LITHIUM IONS; MHZ RANGE 01-100; PHOSPHATES; SCANDIUM; SCANNING ELECTRON MICROSCOPY; SPECTRA; TEMPERATURE RANGE 0273-0400 K; THERMAL GRAVIMETRIC ANALYSIS; X-RAY DIFFRACTION
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; FREQUENCY RANGE; GRAVIMETRIC ANALYSIS; IONS; METALS; MHZ RANGE; MICROSCOPY; MICROSTRUCTURE; OXYGEN COMPOUNDS; PHOSPHORUS COMPOUNDS; PHYSICAL PROPERTIES; QUANTITATIVE CHEMICAL ANALYSIS; SCATTERING; TEMPERATURE RANGE; THERMAL ANALYSIS; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.