Published December 1976 | Version v1
Journal article Metadata-only

Effects of ionizing radiation on a 244 line by 188 element charge injection device imager

Creators

  • 1. Naval Research Lab., Washington, DC

Description

The total dose effects of gamma radiation on an unhardened 244 line by 188 element charge injection device (CID) imager have been investigated. Key device parameters were monitored and the primary failure mechanisms identified. The operating parameters which are compatible with the largest possible total dose tolerance were determined

Additional details

Identifiers

DOI
10.1109/tns.1976.4328556;

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
23
Journal Issue
6
Series
IEEE Trans. Nucl. Sci.
Journal Page Range
1644-1647
ISSN
0018-9499

Conference

Title
IEEE annual conference on nuclear and space radiation effects.
Dates
27 Jul 1976.
Place
San Diego, CA, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
8344208
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
FAILURES; GAMMA RADIATION; PHYSICAL RADIATION EFFECTS; SEMICONDUCTOR DEVICES
Descriptors DEC
ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATION EFFECTS; RADIATIONS

Optional Information

Notes
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