Use of specific features in secondary electron angular distribution for increase of sensitivity of quantitative analysis in Auger electron spectroscopy
Description
A simple method of increasing the sensitivity of the method of electron Auger-spectroscopy characterized by the selection of optimal geometrical conditions of the experiment, namely, a bunch of initial electrons falls on the targets at an angle close to sliding, while the recording of auger electrons is carried out in the normal direction to target surface, is suggested. It is shown that the use of the geographical factor greatly increases the signal/background ratio and permits to record nondifferented auger-spectra with sufficiently high auger-peaks. The vivid nature of such spectra makes it easy to analyze experimental data, lowers the possibility of errors and makes the method of electron auger-spectroscopy accessible for a wide range of scientists
Additional details
Additional titles
- Original title (Russian)
- Использование особенностей в угловых распределениях вторичных электронов для повышения чувствительности количественного анализа в электронной оже-спектроскопии
Publishing Information
- Journal Title
- Zhurnal Tekhnicheskoj Fiziki
- Journal Volume
- 59
- Journal Issue
- 8
- Series
- Zh. Tekh. Fiz.
- Journal Page Range
- 106-107
- ISSN
- 0044-4642
- CODEN
- ZTEFA
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 22000565
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- AUGER EFFECT; AUGER ELECTRON SPECTROSCOPY; ELECTRON BEAMS; ENERGY SPECTRA; INCIDENCE ANGLE; MONOCRYSTALS; NIOBIUM; ORIENTATION; POLYCRYSTALS; SENSITIVITY; TUNGSTEN
- Descriptors DEC
- BEAMS; CRYSTALS; ELECTRON SPECTROSCOPY; ELEMENTS; LEPTON BEAMS; METALS; PARTICLE BEAMS; SPECTRA; SPECTROSCOPY; TRANSITION ELEMENTS