Published 2003
| Version v1
Book
Tungsten transition-edge sensors for IR/optical/UV photon counting
- 1. National Institute of Standards and Technology, Boulder, CO (United States)
- 2. Boston Univ., Quantum Imaging Lab., Boston, MA (United States)
Description
Tungsten transition-edge sensors have been demonstrated to have impressive photon-counting capabilities. Of particular interest is the expected impact to the applications of low-flux astronomy and photonic quantum information. The combination of high quantum efficiency, negligible dark count rate, and moderate energy resolution is unique among IR/optical/UV single-photon detectors and has enabled a new class of measurements to be performed for the first time. This paper gives a background on tungsten TES (W-TES) technology and major applications and discusses recent progress at NIST toward devices with improved optical efficiency. (author)
Additional details
Publishing Information
- Publisher
- Universal Academy Press, Inc.
- Imprint Place
- Tokyo (Japan)
- ISBN
- 4-946443-76-2
- Imprint Title
- International progress on advanced optics and sensors. Proceedings of international workshop on extreme optics and sensors
- Imprint Pagination
- 489 p.
- Journal Page Range
- p. 415-419
Conference
- Title
- International workshop on extreme optics and sensors
- Dates
- 14-17 Jan 2003
- Place
- Tokyo (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 35083666
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CALORIMETERS; INFRARED RADIATION; INFRARED SPECTRA; NEAR INFRARED RADIATION; SQUID DEVICES; SUPERCONDUCTING DEVICES; SUPERCONDUCTING FILMS; TEMPERATURE RANGE 0000-0013 K; TUNGSTEN; ULTRAVIOLET RADIATION; ULTRAVIOLET SPECTRA; VISIBLE RADIATION; VISIBLE SPECTRA
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUXMETERS; INFRARED RADIATION; MEASURING INSTRUMENTS; METALS; MICROWAVE EQUIPMENT; RADIATIONS; REFRACTORY METALS; SPECTRA; SUPERCONDUCTING DEVICES; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Notes
- 7 refs., 2 figs.