Application of digital sampling techniques to particle identification

An application of digital sampling techniques is presented which can greatly simplify experiments involving sub-nanosecond time-mark determinations and energy measurements with nuclear detectors, used for Pulse Shape Analysis and Time of Flight measurements in heavy ion experiments. In this work a 100 M Sample/s, 12 bit analog to digital converter has been used: examples of this technique applied to Silicon and CsI(Tl) detectors in heavy-ions experiments involving particle identification via Pulse Shape analysis and Time of Flight measurements are presented. The system is suited for applications to large detector arrays and to different kinds of detectors. Some preliminary results regarding the simulation of current signals in Silicon detectors are also discussed. (authors)