Band-pass filters based on photonic crystal
Creators
- 1. Department of Physics, Reshetnev Siberian State Aerospace University, Krasnoyarsk 660037 (Russian Federation)
- 2. Laboratory of electrodynamics and microwave electronics, Kirensky Institute of Physics, Krasnoyarsk 660036 (Russian Federation)
Description
Multilayer photonic crystal structures with bleaching layers are being investigated. In order to calculate the characteristics of ultra-wideband filters on their basis, T-lines lossless model was used. Amplitude-frequency characteristics for the synthesized filters of 5th, 11th and 17th orders are given. It is proved that by a significant increase in filter N order, the difference between the connection coefficients of central resonators' layers' becomes negligible. This makes it possible to develop 27-order filter, in which almost half of the layers are realized by periodic interchange of only two identical high-contrast materials. The investigated band-pass filters, including the ones on a glass substrate, have high frequency-selective properties at a relative bandwidth of 80%. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/917/6/062043Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 917
- Journal Issue
- 6
- Journal Page Range
- [5 p.]
- ISSN
- 1742-6596
Conference
- Title
- 4. International School and Conference on Optoelectronics, Photonics, Engineering and Nanostructures
- Acronym
- Saint Petersburg OPEN 2017
- Dates
- 3-6 Apr 2017
- Place
- Saint-Petersburg (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52061077
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BLEACHING; CRYSTAL STRUCTURE; GLASS; LAYERS; NANOSTRUCTURES; PHOTONS; RESONATORS; SUBSTRATES
- Descriptors DEC
- BOSONS; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; MASSLESS PARTICLES